(a) Three cycles consisting of alternating polarity pulsing (initial 500 pulses) followed by single positive polarity (RESET) pulsing (next 125 pulses), using for a Ti-LPCMO interface at room temperature. Resistance values were measured by means of a small current. Inset: scheme of the experimental set up. (b) Simulation of the same pulsing protocol for a stimulus a.u. (c) Simulated density vacancy profiles at site i for selected states labeled in (b). Sites 0–20 correspond to the bulk (B) and sites 21–30 to the right interface (R). Inset: scheme of bulk-interface region employed in the simulations. Otherwise stated, model parameters are as in Ref. 4 that it can be seen for further details.
(a) Normalized HR resistance values of a Ti-LPCMO interface obtained upon pulsing with single polarity RESET pulses of different amplitudes, starting from an initial value. Model simulations are also shown by the blue solid lines. The arrow indicates the direction of increasing amplitudes. Inset: Experimental values vs. pulsing amplitude for (vertical line in a)). The solid line is an exponential fit. (b) Simulated vacancies density profiles for selected pulses and different simulated stimulus amplitudes in the range a.u.
Semilog plot of the number of pulses vs the experimental (simulated) stimulus pulsing for different values selected from Fig. 2. Solid (open) symbols correspond to experimental (simulated) data.
Resistance change as a function of the number of pulses followed by a single SET pulse, always using . The line is a guide for the eye. Inset: Raw data comparing five consecutive runs with = 100 (black circles) with data of one run with = 500 (blue squares).
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