AFM image of the SrTiO3 substrate surface after the chemical treatment and annealing, showing the formation of large, atomic flat, well regulated terraces. The inset shows a height profile corresponding to the indicated line.
2- x-ray diffraction selected area scans of 40 nm thick Co:TiO2 films with and without the 5 nm thick TiO2 layer. The scans were shifted vertically for better visibility. The inset shows the XRD rocking curve for the buffered film.
AFM images of Co:TiO2 films grown grown (a) with and (b) without the TiO2 buffer layer.
Magnetic hysteresis loops performed at 5 K for the (a) unbuffered and (b) buffered Co:TiO2 films and on the bare SrTiO3 substrate.
The Ti and Co 2p XPS spectra for the unbuffered Co:TiO2 film.
Cross-sectional bright field image of the Co:TiO2 unbuffered film. Inset shows a high resolution TEM image of the emphasized region containing surface clusters.
EDX elemental mappings of a region in the unbuffered Co:TiO2 film containing surface clusters.
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