1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Intermittent contact interaction between an atomic force microscope cantilever and a nanowire
Rent:
Rent this article for
USD
10.1063/1.4705519
/content/aip/journal/jap/111/9/10.1063/1.4705519
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/9/10.1063/1.4705519
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) AFM cantilever with an attached nanowire. (b) Sphere-above-plate geometry. (c) Corresponding situation for a AFM cantilever above a nanowire. (d) Sphere-above-cylinder geometry.

Image of FIG. 2.
FIG. 2.

Force-distance relationships for a silicon cantilever above a substrate (thin line) with a Young’s modulus of and on a nanowire with a spring constant of (bold lines). An adhesion force of leads to a hysteresis in the latter case.

Image of FIG. 3.
FIG. 3.

Simulated distance-dependent resonance curves on substrates with (a) a Young’s modulus of and (b) of .The adhesion force is .

Image of FIG. 4.
FIG. 4.

Simulated distance-dependent resonance curves of a cantilever on a nanowire with spring constants (a) , (b) , and (c) at low adhesion of . (d) Resonance curves on a nanowire with for different adhesion forces.

Image of FIG. 5.
FIG. 5.

(a) Intermittent-contact AFM image of tin oxide nanowires. Zooming in one finds artifacts according to Ref. 17. Line profiles were taken (b) along and (c) perpendicular to an individual nanowire. From the line profile in (b) one derives a 50° tilt of the wire to the surface normal. The SEM image in the inset of (a) has a matching scale.

Image of FIG. 6.
FIG. 6.

Comparison of ((a) and (c)) experimental and ((b) and (d)) simulated distance-dependent resonance curves on tin oxide nanowires. The simulations were performed with a spring constant of and an adhesion force of (b) and (d) .

Image of FIG. 7.
FIG. 7.

(a) SEM image of an array of silicon nanowires with a AFM image as inset ( wide). From the line profile (b) along a nanowire, it is concluded that the wire is tilted by 70° from the normal direction. The line profile (c) was recorded perpendicular to a nanowire.

Image of FIG. 8.
FIG. 8.

Comparison of distance-dependent resonance curves on a silicon nanowire. (a) Experimental curves with an estimated effective spring constant of and (b) simulated curves with a spring constant of and an adhesion force of .

Loading

Article metrics loading...

/content/aip/journal/jap/111/9/10.1063/1.4705519
2012-05-02
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Intermittent contact interaction between an atomic force microscope cantilever and a nanowire
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/9/10.1063/1.4705519
10.1063/1.4705519
SEARCH_EXPAND_ITEM