SEM images of the Y2O3 films under different oxygen pressure (a) 0.2 Pa (b) 1 Pa (c) 3 Pa (d) 5 Pa (e) 10 Pa, and (f) cross-sectional SEM image of the sample at 5 Pa.
XRD spectra of Y2O3 films under different oxygen pressure.
Schematic diagrams of the crystallographic surface morphology of the preferentially (a) (222) and (b) (400) oriented films.
Reflectance spectra of Si substrate and Y2O3 films under different oxygen pressure.
(a) Excitation spectra of Y2O3:Bi3+, Yb3+ film at 5 Pa monitored at 494 nm and 976 nm; (b) emission spectra of visible-NIR PL spectra of Y2O3:Bi3+, Yb3+ films at 5 Pa upon excitation of Bi3+ at 331 nm. The inset shows the dependences of Bi3+ and Yb3+ emission intensity on the oxygen pressure.
Schematic energy level diagram of Bi3+ and Yb3+ with transitions in the Y2O3 film phosphors.
Article metrics loading...
Full text loading...