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Determination of optical properties of percolated nanostructures using an optical resonator system
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10.1063/1.4768202
/content/aip/journal/jap/112/10/10.1063/1.4768202
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/10/10.1063/1.4768202
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic presentation of the layer system.

Image of FIG. 2.
FIG. 2.

Experimental reflectance spectra obtained from Ag layer of (a) 17 nm, 33 nm, 50 nm, and 90 nm and (b) 1 nm, 2 nm, 3 nm, 4 nm, 5 nm, and 6 nm nominal thicknesses applied on the ZnO ORL.

Image of FIG. 3.
FIG. 3.

Experimental reflectance spectra obtained from Ag layer of 3 nm nominal thicknesses applied on the ZnO and SiO2 ORLs.

Image of FIG. 4.
FIG. 4.

Experimental reflectance spectra of silver layers on SiO2 substrates (lines 1 and 2) or a SiO2 ORL (lines 3 and 4) before (lines 1 and 3) and after (lines 2 and 4) annealing.

Image of FIG. 5.
FIG. 5.

(a) SEM images of a 3 nm, (b) 10 nm, and (c) 20 nm-thick Ag layer on a ZnO ORL.

Image of FIG. 6.
FIG. 6.

SEM images of metallic island films obtained by thermal evaporation of 10 nm Ag on c-Si before (a) and after (b) annealing treatment at 180 °C during 50 min. SEM images of metallic island films obtained by thermal evaporation of 3 nm Ag on ZnO before (c) and after (d) annealing treatment at 180 °C during 30 min.

Image of FIG. 7.
FIG. 7.

AFM image of 3 nm Ag on laboratory glass on an area of 1 μm × 1 μm after annealing (250 °C for 1 h). The nanoparticles are separated. The nanoparticles have an average height and diameter estimated at 30 nm and 120 nm, respectively.

Image of FIG. 8.
FIG. 8.

Reflectance measurements (dash lines) and calculated spectra (solid lines) for 4, 17 nm-thick Ag layers on ZnO ORLs and 3 nm-thick Ag layers on SiO2 ORLs before and after an annealing treatment.

Image of FIG. 9.
FIG. 9.

Ag volume fraction and thickness of the deposited layer on the ZnO ORL, calculated by fitting the experimental reflectance spectra, versus the nominal thickness estimated from mass measurements. The dots are the results of the fits. SEM images of a 3 nm, a 10 nm, and a 20 nm-thick Ag layer on a ZnO ORL are included to facilitate the analysis.

Image of FIG. 10.
FIG. 10.

Variations of the real part (a) and imaginary part (b) of the effective dielectric function of the Ag layer during the deposition on a ZnO ORL. The curves calculated for 65% of Ag volume fraction is added to facilitate the interpretation. (c) Real part and imaginary part of the effective dielectric function of the 3 nm thick Ag layer on a SiO2 ORL after the annealing.

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/content/aip/journal/jap/112/10/10.1063/1.4768202
2012-11-30
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of optical properties of percolated nanostructures using an optical resonator system
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/10/10.1063/1.4768202
10.1063/1.4768202
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