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Analysis of critical dimensions for axial double heterostructure nanowires
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10.1063/1.4767927
/content/aip/journal/jap/112/11/10.1063/1.4767927
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/11/10.1063/1.4767927
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of an axial double heterostructure nanowire.

Image of FIG. 2.
FIG. 2.

Stress field distributions with different height of medium layer: (a) in the plane, nm, nm; (b) along the wire axis; (c) in the plane, nm, nm; and (d) along the wire axis.

Image of FIG. 3.
FIG. 3.

The relationship between height of mediumlayer h and radius when mediumlayer just recover to the stress-free state.

Image of FIG. 4.
FIG. 4.

(a) Dependence of the total energy with different dislocation position on indium contents. , total energy with dislocation at under-medium interface. , total energy with dislocation at medium-over interface; and (b) Dependence of total energy difference with different dislocation position, , on indium contents. For both (a) and (b), the nanowires radius is 30 nm. The insets show the magnified images of selected regions.

Image of FIG. 5.
FIG. 5.

Dependence of total energy difference with different dislocation position on nanowire radius. The indium content is 29%.

Image of FIG. 6.
FIG. 6.

(a) Dependence of the critical thickness on the nanowire radius for different lattice mismatch. Symbols give the radius of heterostructured nanowires grown with (open symbol) or without (full symbols) dislocations for lattice mismatch f = 1.6%(diamond 17 ), 3.5%(circle 8,18 ), 0.7%(square 6 ); and (b) Dependence of the two critical radiuses on the lattice mismatch. The area between two lines in (a) is the dislocation-controllable region, the left and right lines are the dislocation-free critical radius and dislocation-unavoidable critical radius, respectively.

Image of FIG. 7.
FIG. 7.

Comparison between the dislocation-free critical radius for single heterostructures 11 (denoted as a green dotted line) and double heterostructure with different mediumlayer thickness.

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/content/aip/journal/jap/112/11/10.1063/1.4767927
2012-12-03
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of critical dimensions for axial double heterostructure nanowires
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/11/10.1063/1.4767927
10.1063/1.4767927
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