(a) Typical XRD spectra of the LCMO films grown on (001) NSTO substrates. (b) The cross-sectional high-resolution images taken along the NSTO zone axis of the interface region.
I-V characteristics of the LCMO/NSTO heterojunction measured in a wide temperature range from 293 to 623 K. Inset plot is the schematic diagram showing the samples, electrodes setting, and the circuit of the measurement used in our experiments.
Temperature dependent on the voltage Vb and Vt at bias current of ±0.2 mA, respectively. Thin line is a guide for the eyes.
Transient photovoltaic responses for LCMO/NSTO heterojunction at different temperature under the 248 nm laser illumination.
(a) The corresponding peak photovoltage Vp as a function of temperature. (b) Temperature dependence of FWHM of photoresponse pulses. Thin line is a guide for the eyes.
Forward-bias I-V characteristics at 523 K, 573 K, and 623 K. The red lines are the fitting curves.
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