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(a) Magnetization vs. external field along both in-plane and perpendicular directions as a function of x in Sub/Ta/MgO/CoFeB/Nb (x = 1–2.5 nm) films. (b) The same results as (a) but with low-filed scales.
Effective anisotropy constant (Keff) vs. the thickness of the Nb cap layer in Sub/Ta/MgO/CoFeB/Nb (x = 1–2.5 nm) films. The inset shows the remanence and coercivity extracted from Fig. 1 . The PMA clearly only occurs within a window of the cap layer thickness of 1.2–2.5 nm.
Effective anisotropy constant (Keff) vs. the thickness of Ta and Ru in Sub/Ta/MgO/CoFeB/cap (cap = Ta or Ru) films. The Ta series shows a similar effect of Nb in that Keff > 0 only occurs within a small window of <3.5 nm, while Ru shows a weaker effect and Keff remains negative.
Ki of Sub/Ta/MgO/CoFeB/cap (cap = Nb and Ta) as a function of the cap layer thickness.
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