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Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge
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10.1063/1.4742987
/content/aip/journal/jap/112/3/10.1063/1.4742987
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/3/10.1063/1.4742987
/content/aip/journal/jap/112/3/10.1063/1.4742987
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/content/aip/journal/jap/112/3/10.1063/1.4742987
2012-08-03
2014-10-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/3/10.1063/1.4742987
10.1063/1.4742987
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