HRTEM micrograph (left) and respective Fourier-transforms (right) of AlN on Pt exhibiting immediate c-axis orientation of the AlN deposit.
(a) XRD 2-theta scan of exclusively c-axis oriented pure AlN (substrate peaks are omitted due to detector limitations). (b) XRD rocking curves of AlN deposited continuously (black, solid), periodically interrupted (dotted, blue), and with embedded Co particles, f = 0.02 (dashed, red). (c) XRD 2-theta scan of AlN/Co composite with f = 0.02 deposited with the same procedure as (a).
(a) TEM bright field image recorded on a cross-section of a triple layer consisting of 300 nm AlN–450 nm [AlN/Co]–150 nm AlN deposited on Pt(111). (b)–(d) respective SAED patterns from the circled areas of (a) with attached magnified sections (each right). See text for details.
Increase of effective with Co content of nanogranular AlN/Co composite. Red line: fit of according to Eq. (4).
Dielectric loss of AlN/Co composite versus Co filling factor.
Simulation of the electric potential in a PZT cell containing a Terfenol-D sphere upon application of an external magnetic field for a conductive (a) and an insulating (b) particle. (c) and (d) represent xz-plane cross-sections of (a) and (b), respectively. All graphs are presented in the same scale.
Summary of deposition parameters for AlN/Co composites.
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