The intermediate reference frames O-G 1 G 2 G 3 to describe the orientation in the crystal reference frame O-X 1 X 2 X 3 (a) and the specimen reference frame O-x 1 x 2 x 3 (b).
Bragg diffraction at the specific planes within the irradiated region in polycrystalline thin film.
Residual stresses in PZT thin films prepared by PLD (a), RF-MS (b), and MOD (c).
The normal strain along the normal to an oblique plane ( plane).
The theoretical analysis on residual stresses in PZT thin films prepared by PLD (a), RF-MS (b), and MOD (c).
Bragg angles and diffraction intensities for PZT powder and thin films.
Material parameters of the thin films.
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