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Effect of grain orientation in x-ray diffraction pattern on residual stress in polycrystalline ferroelectric thin film
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10.1063/1.4748052
/content/aip/journal/jap/112/4/10.1063/1.4748052
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/4/10.1063/1.4748052
/content/aip/journal/jap/112/4/10.1063/1.4748052
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/content/aip/journal/jap/112/4/10.1063/1.4748052
2012-08-31
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of grain orientation in x-ray diffraction pattern on residual stress in polycrystalline ferroelectric thin film
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/4/10.1063/1.4748052
10.1063/1.4748052
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