DTA pattern obtained from powder containing heat treated (693 K) precursor gel.
Rietveld refinement profiles of x-ray powder diffraction data for the specimen. The solid line is the calculated profile and a difference curve is plotted at the bottom.
(a) Transmission electron micrograph for the specimen; (b) high resolution electron micrograph; (c) selected area electron diffraction pattern from (a).
Variation of magnetization as a function of temperature under ZFC and FC condition of the sample measured in magnetic field 500 Oe. Inset shows Curie-Weiss fit (solid line) curve of the FC data.
Magnetization versus magnetic field hysteresis loops for the specimens (at different temperatures).
Mn 2p XPS spectra of the sample.
Variation of logarithm of resistivity of the specimen as a function of inverse temperature. Solid line fitted with Eq. (1).
Variation of magnetization as a function of time with different tw for specimen. The solid line is the fitted curve based on stretched exponential function. (Inset) variation of S(t) as a function of time for different values of tw.
The temperature dependence of the ac susceptibility of the sample at different frequencies.
(a) Variation of dielectric constant and loss factor (tan δ) of the specimen as a function of temperature at 10 kHz frequency. (b) Polarization–electric field hysteresis loop for the sample at 123 K.
Lattice parameters and atomic coordinates from Rietveld refinement of x-ray diffraction data obtained for the specimen. Rwp = 7.94% and Rp = 6.21%.
The chemical composition and stoichiometry ratio of specimenY2NiMnO6 as analyzed by EDAX measurements.
Summary of extracted parameters of fitted equations (1) and (2) for the specimen.
Extracted parameters of fitted equation (4) for different wait time at 65 K.
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