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Structural study in highly compressed BiFeO3 epitaxial thin films on YAlO3
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Image of FIG. 1.
FIG. 1.

The schematics of each structure and the corresponding diffraction features:(a) MC, with the shear orientation along [100] direction, (b)MA, with the shear orientation along [110], and (c)T phase, without shear angle. The shear angle will cause the peak splitting due to the four kinds of domains, and its direction will results in the reverse patterns in the (H0L) and (HHL) scattering zones.

Image of FIG. 2.
FIG. 2.

(a) X-ray normal scan of a BFO thin film with reference to YAO (001)pc peaks at various temperatures. Dashed line is used as a guide to visualize the shifts of the MII peaks. (b) c-axis lattice parameters of BFO (001) and YAO (001)pc from RT to 400 °C. (c) and (d) show experimental RSMs of (103) and (113) of our BFO thin film at RT. (e) and (f) are the RSMs of (103) and (113) of the BFO thin film at 150 °C. (g) and (h) are the RSMs of (103) and (113) of the BFO thin film at 275 °C. These RSMs unveiled the phase transition of MC-MA-T.

Image of FIG. 3.
FIG. 3.

(a) Schematics of the ferroelectric polarizations in MC, which shows four kinds in-plane polarization variants on the {100} planes. Three contrasts (blue, green, and red) are expected from PFM measurements when the cantilever is aligned to [100]. (b) Schematics of the ferroelectric polarizations in MA, which also have four in-plane polarization variants on {110}. However, when conducting PFM measurements with the cantilever aligned to [100], two contrasts (dark, light) are expected in MA. (c) AFM and PFM phase images of a BFO sample at RT with the cantilever aligned to [100]. (d) AFM and PFM phase images of the same scanning area and direction as shown in (c) but at 150 °C. The blue, green, and red arrows in phase images of (c) and (d) indicate the directions of the in-plane polarization variants illustrated in (a) and (b). The combinations of these polarization variants would cause the stripe-like and puddle-like domain features in MC and MA, respectively.

Image of FIG. 4.
FIG. 4.

(a)-(d) X-ray normal reciprocal space maps (RSM) of thin films with various thicknesses. MII, MII,tilt, MI, and R phase are marked near the position of relevant peaks. (e) and (f) are the rocking curves of MI and MII phases with the in-plane vector along (100)pc and (010)pc with different thickness.

Image of FIG. 5.
FIG. 5.

The topography of (a) 18 nm, (b) 60 nm, (c) 180 nm, and (d) 300 nm BFO thin films grown on YAO substrate. (e) 120 nm BFO grown on LAO substrate. (f) line-trace along the blue line and red line in (d), which shows different periodic arrangement of strips at [100]pc,YAO and [010]pc,YAO. Unlike the uniform arrayed stripes along both LAO [100] and [010] observed in (e), this arrayed stripe anisotropy should results from the lattice difference of a-axis and b-axis of the YAO substrate.

Image of FIG. 6.
FIG. 6.

(a) The ratio of c/a and a/b are calculated from Table I at different thickness, indicating a stably MII phase can survive at thickness above 300 nm. (b) The variation of shear angle of MII phase gradually decreases as thickness increases.


Generic image for table
Table I.

Lattice parameters of monoclinic BFO phase grown on YAO and LAO substrates with different thickness


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural study in highly compressed BiFeO3 epitaxial thin films on YAlO3