Low-frequency Raman spectra of Si/Ge nanoparticles embedded in SiO2/GeO2 matrix: (a) Ge/SiO2, (b) Ge/GeO2, and (c) Si/SiO2. Full curve: total fitted spectrum and dashed curves: individual fitted peaks. The spectra obtained with an unpolarized 532 nm wavelength laser line.
Acoustic mode frequencies for SiO2/GeO2 embedded Si/Ge nanoparticles Vs 1/R; along with other experimental data: (a) Si and (b) Ge.
Low-frequency spectra calculated using the CSM for Si/Ge nanoparticle embedded in SiO2/GeO2: (a) l = 0 mode for Si/SiO2 and Ge/SiO2. (b)l = 0 mode for Ge/SiO2 and Ge/GeO2.
Dependence of the FWHM on 1/R of the l = 0, n = 0 spheroidal phonon mode and l = 2, n = 0 Raman data along with other experimental data.
Optical Raman spectra for Si/SiO2, Ge/SiO2 and Ge/GeO2.
Eigen frequencies of spheroidal modes in (cm−1) of Si/SiO2, Ge/SiO2, and Ge/GeO2 of different sizes, respectively.
Comparison of frequency ratio (v o/v 2) is the frequency of the l = 2, n = 0; SPH mode.
Comparison ratio of intensity ratio of Si/SiO2, Ge/SiO2, and Ge/GeO2.
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