The experimental setup used for optical reflection measurements.
Cross-sectional scanning electron micrographs of a produced PS layer. (a) Thickness of the layer, (b) a particular pore and a particular Si pillar is marked in magnified image by × 60.
Reflection spectra and experimental refractive indices versus wavelengths for samples given in Table I .
Semi-empirical refractive indices (filled square) and extinction coefficients (filled circle) from the K-K method and experimental refractive indices from the positions of adjacent maxima (unfilled circle) for (a) S1, (b) S2, (c) S3, and (d) S4, respectively, in the recorded optical reflection spectra.
The PS layers characteristics.
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