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Analysis of optical properties of porous silicon nanostructure single and gradient-porosity layers for optical applications
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10.1063/1.4748335
/content/aip/journal/jap/112/5/10.1063/1.4748335
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/5/10.1063/1.4748335

Figures

Image of FIG. 1.
FIG. 1.

The experimental setup used for optical reflection measurements.

Image of FIG. 2.
FIG. 2.

Cross-sectional scanning electron micrographs of a produced PS layer. (a) Thickness of the layer, (b) a particular pore and a particular Si pillar is marked in magnified image by × 60.

Image of FIG. 3.
FIG. 3.

Reflection spectra and experimental refractive indices versus wavelengths for samples given in Table I .

Image of FIG. 4.
FIG. 4.

Semi-empirical refractive indices (filled square) and extinction coefficients (filled circle) from the K-K method and experimental refractive indices from the positions of adjacent maxima (unfilled circle) for (a) S1, (b) S2, (c) S3, and (d) S4, respectively, in the recorded optical reflection spectra.

Tables

Generic image for table
Table I.

The PS layers characteristics.

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/content/aip/journal/jap/112/5/10.1063/1.4748335
2012-09-05
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of optical properties of porous silicon nanostructure single and gradient-porosity layers for optical applications
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/5/10.1063/1.4748335
10.1063/1.4748335
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