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Multi-scale order in amorphous transparent oxide thin films
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View: Figures


Image of FIG. 1.
FIG. 1.

SAED patterns for a-ZITO film grown at 25 °C (room temperature), with inset showing the plots of reduced scattering factor φ(k) for a-ZITO films grown at 25 °C, 100 °C, and 200 °C.

Image of FIG. 2.
FIG. 2.

RDF plots for a-ZITO films grown at different temperatures.

Image of FIG. 3.
FIG. 3.

(a) Model of a-ZITO obtained from liquid quench DFT MD simulations. Oxygen—red, indium—brown, tin—green, zinc—blue. (b) Comparison between the RDF computed for the model of ZITO obtained in the liquid quench simulations at 300 K, RDF calculated from a model prepared by constrained random packing and the corresponding experimental RDF; (c) Partial RDFs for the MD DFT model of a-ZITO.

Image of FIG. 4.
FIG. 4.

(a) Variance plots of a-ZITO film grown at 200 °C for four different experimental probe sizes; (b) linear fit to Eq. (3) in the text.

Image of FIG. 5.
FIG. 5.

(a) Schematic illustration of the correlograph calculation; (b–d) Correlographs of a-ZITO films grown at respectively 25 °C (room temperature), 100 °C, and 200 °C, (e) Cross-correlation coefficient (k = 0.34 ± 0.01 Å−1) plots of a-ZITO films grown at different temperatures as marked.

Image of FIG. 6.
FIG. 6.

(a) SAED pattern for a-ZITO films grown at 400 °C; (b) HRTEM image of a-ZITO film grown at 400 °C, showing a crystalline ZITO phase embedded a disordered matrix.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Multi-scale order in amorphous transparent oxide thin films