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Interface trap characterization and electrical properties of Au-ZnO nanorod Schottky diodes by conductance and capacitance methods
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10.1063/1.4752402
/content/aip/journal/jap/112/6/10.1063/1.4752402
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/6/10.1063/1.4752402
/content/aip/journal/jap/112/6/10.1063/1.4752402
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/content/aip/journal/jap/112/6/10.1063/1.4752402
2012-09-18
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interface trap characterization and electrical properties of Au-ZnO nanorod Schottky diodes by conductance and capacitance methods
http://aip.metastore.ingenta.com/content/aip/journal/jap/112/6/10.1063/1.4752402
10.1063/1.4752402
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