SEM image of as-grown ZnO NRs on n-SiC substrate. The inset shows the SEM image after spin coating followed by soft backing.
(a) Typical room temperature current-voltage characteristics for Au/ZnO NR-based Schottky diode; and (b) log-log plot for the I-V data of Au/ZnO NR-based Schottky diode.
Typical C-V characteristics of the Au/ZnO NR-based Schottky diode measured at room temperature; the inset shows the depth profile.
The C-V characteristics of Au/ZnO NR-based Schottky diodes at different frequencies.
The C–f characteristics of Au/ZnO NR-based Schottky diodes at zero bias. The solid line represents the exponential fitting, and the inset shows the CP-ω plot extracted from the measured data.
The Gp/ω vs. ω characteristics extracted from the measured data.
Energy distribution curve of the interface states calculated from Gp/ω vs. ω measurements.
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