150 μm-thick composite thin film.
SEM pictures of VA-CNTs obtained by AACVD synthesis. (a) cross section before embedded in polymer matrix, (b) and (c) surface top view after embedded and thinning process).
TEM images of the nanotubes obtained by AA-CCVD (a) raw image, (b) automatic segmentation for statistic calculation of diameters).
(a) AFM topography pictures of composite thin film and (b) Single CNT height and phase profile comparison in the case of a CNT exhibiting a 60 nm external (De) and 8 nm internal (Di) diameter.
Evolution of measured resistance in SSRM and CAFM mode as a function of contact force between AFM tip and sample surface.
1 × 2 μm2 current topography over surface of MWCNT embedded in epoxy matrix for 2 mV applied bias (current up to 250 nA (write)). (b) I-V characteristics measured by C-AFM on different single carbon nanotube extracted from current topography for different applied voltage (10 nN contact force).
(a) Comparison of height and current cross-section over single vertical carbon nanotube embedded in polymer matrix for 2 mV applied voltage. (b) Correlation between conductive sheet position and current measured by AFM for punctual tip.
Internal and external nanotube diameter distribution determined by visual inspection and image processing.
Relation between electron transmission probability at electrode/CNT interface and the number of shells involved in conduction established from Eq. (1).
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