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Local current mapping of single vertically aligned multi-walled carbon nanotube in a polymer matrix
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Image of FIG. 1.
FIG. 1.

150 μm-thick composite thin film.

Image of FIG. 2.
FIG. 2.

SEM pictures of VA-CNTs obtained by AACVD synthesis. (a) cross section before embedded in polymer matrix, (b) and (c) surface top view after embedded and thinning process).

Image of FIG. 3.
FIG. 3.

TEM images of the nanotubes obtained by AA-CCVD (a) raw image, (b) automatic segmentation for statistic calculation of diameters).

Image of FIG. 4.
FIG. 4.

(a) AFM topography pictures of composite thin film and (b) Single CNT height and phase profile comparison in the case of a CNT exhibiting a 60 nm external (De) and 8 nm internal (Di) diameter.

Image of FIG. 5.
FIG. 5.

Experimental setup.

Image of FIG. 6.
FIG. 6.

Evolution of measured resistance in SSRM and CAFM mode as a function of contact force between AFM tip and sample surface.

Image of FIG. 7.
FIG. 7.

1 × 2 μm2 current topography over surface of MWCNT embedded in epoxy matrix for 2 mV applied bias (current up to 250 nA (write)). (b) I-V characteristics measured by C-AFM on different single carbon nanotube extracted from current topography for different applied voltage (10 nN contact force).

Image of FIG. 8.
FIG. 8.

(a) Comparison of height and current cross-section over single vertical carbon nanotube embedded in polymer matrix for 2 mV applied voltage. (b) Correlation between conductive sheet position and current measured by AFM for punctual tip.


Generic image for table
Table I.

Internal and external nanotube diameter distribution determined by visual inspection and image processing.

Generic image for table
Table II.

Relation between electron transmission probability at electrode/CNT interface and the number of shells involved in conduction established from Eq. (1).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Local current mapping of single vertically aligned multi-walled carbon nanotube in a polymer matrix