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Room-temperature sign reversed spin accumulation signals in silicon-based devices using an atomically smooth Fe3Si/Si(111) contact
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10.1063/1.4773072
/content/aip/journal/jap/113/1/10.1063/1.4773072
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/1/10.1063/1.4773072
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Figures

Image of FIG. 1.
FIG. 1.

(a) A schematic diagram of the device structure. (b) The cross-sectional transmission electron microscopy image of the contact 2. (c) characteristics measured between contacts 1 and 2 at room-temperature for devices A and B.

Image of FIG. 2.
FIG. 2.

The voltage changes as a function of at room-temperature for (a) device A and (b) device B at . (c) as a function of at room temperature, together with a CoFe/Si(111) device used in Ref. 22 .

Image of FIG. 3.
FIG. 3.

Schematic diagrams of the interface for (a) model A and (b) model B. Closed and open circles are Si and Fe atoms, respectively. Dashed lines denote interfaces between and Si. (c), (d) Local DOS of Fe (I) (interfacial Fe layer) in models A and B. Solid and broken curves are results of and ↓-spin states, respectively. The Fermi level is chosen as the origin of energy. (e) High resolution TEM image of the interface with atomic steps (see-arrows).

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/content/aip/journal/jap/113/1/10.1063/1.4773072
2013-01-07
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Room-temperature sign reversed spin accumulation signals in silicon-based devices using an atomically smooth Fe3Si/Si(111) contact
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/1/10.1063/1.4773072
10.1063/1.4773072
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