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Modeling particle-induced electron emission in a simplified plasma Test Cell
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10.1063/1.4794849
/content/aip/journal/jap/113/11/10.1063/1.4794849
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/11/10.1063/1.4794849

Figures

Image of FIG. 1.
FIG. 1.

Photographic (a) and schematic (b) visualizations of the Test Cell, courtesy of UCLA.

Image of FIG. 2.
FIG. 2.

Energy diagram of the PE process, Auger neutralization, a two-electron process in which a projectile ion is neutralized by one electron while a second electron is emitted via electron-electron interactions.

Image of FIG. 3.
FIG. 3.

Normalized Gaussian functions representing SDOS and EEDF next to previously cited historical PE EEDF data for generalized, theoretical emission 11 and 10 eV xenon ion emission 12 from W.

Image of FIG. 4.
FIG. 4.

Schematic of the KE process in which an incident projectile atom penetrates a material surface, interacting with valence band electrons and resulting in at least one emitted electron.

Image of FIG. 5.
FIG. 5.

Normalized non-central distribution next to previously cited historical KE EEDF data for for various species and metals, 47 generalized theoretical results, 31 0.5 eV Xe on Au, 27 Monte Carlo simulation, 50 and 10 eV Ar on Mo. 48

Image of FIG. 6.
FIG. 6.

Numerical domain of the UCLA experiment, detailing inlet, outlet, symmetry conditions, potential conditions at the walls, and current collecting surfaces inner cylinder, exit plate, and exit orifice.

Image of FIG. 7.
FIG. 7.

Approximately to-scale illustration of the Test Cell and the two processes, MEX and CEX, which create populations of low- and high-energy xenon ions and atoms at both low and high angles.

Image of FIG. 8.
FIG. 8.

Unnormalized comparison of the probability density functions of Eqs. (8) and (18) describing the PE and KE EEDFs.

Image of FIG. 9.
FIG. 9.

Comparison of peak wall fluxes for the unbiased and biased data sets: (a) Xe on the EP; (b) on the IC.

Image of FIG. 10.
FIG. 10.

Illustrations of the unbiased (a), +10 V biased (b), and −10 V biased (c) electron behaviors of the Test Cell. Each of these illustrations attempts to visualize the populations of emitted and collected electrons, including those which are back-streamed.

Image of FIG. 11.
FIG. 11.

Contours of electron number density with accompanying stream-traces illustrating secondary emission of electrons from the inner cylinder (a) and exit plate (b) in which cases of back-streaming and cross-collection are prevalent.

Image of FIG. 12.
FIG. 12.

Original and PIE-included current collection results for the unbiased data set at the inner cylinder (a) and exit plate (b).

Image of FIG. 13.
FIG. 13.

Original and PIE-included current collection results for the +10 V biased data set at the inner cylinder (a) and exit plate (b).

Image of FIG. 14.
FIG. 14.

Original and PIE-included current collection results for the −10 V biased data set at the inner cylinder (a) and exit plate (b).

Image of FIG. 15.
FIG. 15.

Sensitivity analysis of current collection results for the +10 V biased data set at the inner cylinder (a) and exit plate (b) for a range of KE total yields, .

Image of FIG. 16.
FIG. 16.

Sensitivity analysis of current collection results for the −10 V biased data set at the inner cylinder (a) and exit late (b) for a range of PE total yields, .

Tables

Generic image for table
Table I.

Summary of parameters for the PE and KE processes including their location, total yield, and their EEDF model

Generic image for table
Table II.

Summary of electron collection percentage, P, illustrated in Figure 10 , which is notated by matching the emitting electrode of interest with the collecting electrode for the environment of interest with the resulting value describes the percentage of emitted electrons which arrive at the collector.

Generic image for table
Table III.

Total current values used in the simulations for DSA (a) and DSC (b), fit to the experimental data and using Eqs. (A1) (A4) .

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/content/aip/journal/jap/113/11/10.1063/1.4794849
2013-03-18
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Modeling particle-induced electron emission in a simplified plasma Test Cell
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/11/10.1063/1.4794849
10.1063/1.4794849
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