A schematic of the experimental setup. Specimens are exposed to He plasmas in the linear plasma device NAGDIS-II.
(a) and (b) are the SEM micrographs of the Ti and SS samples, respectively, exposed to the helium plasma. Nanocones are formed on the surface. The surface temperature was approximately 550 K and the incident ion energy and helium fluence are 75 eV and 6.4 × 1025 m−2, respectively.
(a) and (b) are the TEM micrographs of the Ti and SS samples, respectively, exposed to the helium plasma.
(a) The setup for total reflectance measurement system. (b) and (c) The angular dependences of the total reflectance of Ti and SS specimens for p and s polarizations, respectively. Open and closed markers correspond to the reflectance before and after the helium irradiation, respectively.
(a) A picture of a He irradiated Ti. (b) A SEM micrograph of the boundary region between irradiated and non-irradiated areas on the Ti sample.
SEM micrographs of (a) Ti, (b) Ni, and (c) Fe exposed to the helium plasmas.
(a) and (b) TEM micrographs of Ti exposed to He plasma at the surface temperature of 850 K and the incident ion energy of 73 eV with the He fluence of 2.6 × 1025 m−2.
(a) A SEM micrograph of W exposed to He plasma. (b) and (c) TEM micrographs of W exposed to He plasma. (b) is a bright field image and (c) is a dark field image.
XPS spectra for the nanostructured tungsten and WO3 powder.
Time courses of MB decolorization over the tungsten samples exposed to helium plasma. The edge wavelengths of the used longpass filters were 520 (square) and 700 nm (circle).
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