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Preisach analysis of sputtered SmCo thick films
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10.1063/1.4799410
/content/aip/journal/jap/113/14/10.1063/1.4799410
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/14/10.1063/1.4799410
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Figures

Image of FIG. 1.
FIG. 1.

TEM cross-section image of Sm25Co75 film sputtered onto a heat substrate at 350 °C. The bright interface between Sm25Co75 and Pt is a passivation layer formed due to the oxidation of the Sm25Co75 film surface. Pt was deposited during sample preparation for TEM imaging. The Sm25Co75 film is 1.8 μm thick. The yellow dashed lines indicate a columnar growth of the film.

Image of FIG. 2.
FIG. 2.

Conventional hysteresis loop (a), set of experimental FORC measurements (b), and best fitting of FORC measurements (c) for Sm25Co75. The best fitting was obtained with parameters λ 1 = 0.74, α 1 = 0, λ 2 = 0.16, α2  = 0.10,  = 0.510 T, μ 0  = 1.260 T (without any reversible component), μ 0  = 0.056 T,  = 0.080 T, and ω 1 = 0.160 T. All the other relevant parameters were set equal to zero.

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/content/aip/journal/jap/113/14/10.1063/1.4799410
2013-04-09
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Preisach analysis of sputtered SmCo thick films
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/14/10.1063/1.4799410
10.1063/1.4799410
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