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Powder x-ray diffraction pattern of La0.5Sr0.5CoO3: (a) Rietveld refined profile for S-2 where open circle shows the observed pattern, the dashed line shows the calculated pattern, the bottom line shows the difference pattern, and the markers represent the Bragg peak positions and (b) XRD pattern for the sample S-1.
Temperature dependence of the in-phase (a) component of ZFC ac susceptibility for the La0.5Sr0.5CoO3 samples at different stage of the sample preparation. (b) Result of the memory experiment: difference curve Δχ″(T) = χ″mem(T) − χ″ref(T) for the samples S-1 and S-2 around the halting temperature 30 K. (c) and (d) Frequency dependence in the temperature dependent out-of-phase component ZFC ac susceptibility for S-1 and S-2, respectively.
Temperature dependent FC dc magnetization for the sample S-1 at (a) 1000 Oe and (b) 2000 Oe. (c) 1000 Oe MFC(T) for S-2. The insets show the magnified view of the corresponding same data at the low temperature. (c) M-H hysteresis loops for S-1 and S-2 at 2 K. The inset shows the zoomed in view of the same around the 14 T field.
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