XRD patterns for (a) out-of-plane θ–2θ and (b) in-plane φ scans of MgAl2O4/Fe2VSi(3 nm)/Fe2CrSi(5 nm)/Ru2MnGe (20 nm).
(a) Hysteresis loop of Fe2CrSi/Ru2MnGe bilayer with T sub = 573 K during deposition of Ru2MnGe layer measured at 77 K. (b) Exchange-anisotropy field H ex and unidirectional anisotropy constant J k as a function of T sub in Fe2CrSi/Ru2MnGe bilayers.
Unidirectional anisotropy constant J k as a function of Ru2MnGe thickness in Fe2CrSi/Ru2MnGe bilayer.
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