SEM image of different sizes of center defect pinning sites at the center of the composite pinning array.
Critical current vs. magnetic field at different temperatures for sample A.
Critical current vs. magnetic field for sample A (green line) and D (blue line). It is apparent that the number of matching peak in the honeycomb arrays is more than in the triangular arrays.
Critical current vs. magnetic field for sample B (black line) and C(red line). Higher than 900 G, there is still a obvious matching peak showed up.
This is the distribution of superconducting electronics. The simulation results for the amplitude of order parameter for superconductor with honeycomb pinning array at (a) the second matching fields, (b) the third matching fields, (c) the third and half matching fields, and (d) the fourth matching fields.
Article metrics loading...
Full text loading...