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(001) oriented L10 FePt/B4C multilayer thin films on naturally oxidized Si substrate
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10.1063/1.4795324
/content/aip/journal/jap/113/17/10.1063/1.4795324
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4795324
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The XRD patterns of sample A-E; inset (a), the texture parameter of (001) orientation (P) versus layer thickness of FePt; inset (b), the chemical ordering degree (S) versus layer thickness of FePt.

Image of FIG. 2.
FIG. 2.

TEM images of sample E after annealed at 600 °C for 15 min: (a) the (Fe/Pt)/BC multilayer structure; (b) a single FePt unit layer and its adjacent BC layers; (c) a high resolution TEM image of FePt layer. (d) The experimental NRBS spectrum (dark filled circles) of the sample E and its simulated spectrum (gray open circles).

Image of FIG. 3.
FIG. 3.

The PPMS loops of annealed samples E (a), D (b), and C (c) with magnetic field perpendicular to the sample surface and (d) the δM plots of annealed sample C (half-up solid circle curve) and E (solid square curve).

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/content/aip/journal/jap/113/17/10.1063/1.4795324
2013-03-21
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: (001) oriented L10 FePt/B4C multilayer thin films on naturally oxidized Si substrate
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4795324
10.1063/1.4795324
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