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Influence of interface roughness on the exchange bias of Co/CoO multilayers
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10.1063/1.4795437
/content/aip/journal/jap/113/17/10.1063/1.4795437
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4795437

Figures

Image of FIG. 1.
FIG. 1.

XRR profiles (solid lines) and respective fitted (dashed lines) for B1, M1 and M2 multilayer. The curves have been shifted vertically for clarity.

Image of FIG. 2.
FIG. 2.

Cross-sectional TEM image of Si(100)/[Co 10 nm/CoO 10 nm]/Co 10 nm layered structure.

Image of FIG. 3.
FIG. 3.

Magnetization hysteresis loops for B1 (top pinned) & B2 (bottom pinned) bilayer (a) and M2 multilayer (b). All the measurements were done at 80 K after field cooling. The dashed arrows indicate the orientation of magnetic moment of each Co layer.

Image of FIG. 4.
FIG. 4.

Magnetoresistance curve (solid line) and corresponding hysteresis loop (dashed line) for M2 multilayer.

Tables

Generic image for table
Table I.

Relevant structure and magnetic properties of B1, M1, and M2 multilayers.

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/content/aip/journal/jap/113/17/10.1063/1.4795437
2013-03-19
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of interface roughness on the exchange bias of Co/CoO multilayers
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4795437
10.1063/1.4795437
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