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XRD spectra for (a) Pt/(Co/Pt)×16 and (b) Pd/(Co/Pd)×16 multilayer films.
The thickness t Co dependence of product K eff · t for Co/Pt and Co/Pd MLs. The data points are fitted to a linear function in order to derive the volume and interface anisotropies in Eq. (2) .
Resistivity ρ as a function of the out-of-plane angle θ, measured from surface normal to the in-plane transverse direction for (a) Pt/(Co/Pt)×40 and (b) Pd/(Co/Pd)×80 MLs in a magnetic field of 5 T.
Co thickness dependence of AIMR ratio ( ρ p − ρ t)/ ρ t in 5 T of magnetic field for Co/Pt and Co/Pd MLs.
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