Temperature dependence of resistivity of the film sample ρm = ρ − ρmin between 2 K and 11 K. The dashed line represents the NRG fitting. The inset shows resistivity as a function of temperature measured between 2 K and 300 K.
TEM image of Cu(Fe) clusters deposited on TEM grid. The inset is the cluster size distribution measured from the sample.
ZFC measurement of Cu(Fe) clusters embedded in a SiO2 matrix. The solid line is the fit to the data. The inset is the M vs. H curve measured at 2 K and the dashed line is the Brillouin function fit to the data.
Energy levels for two interacting S = 1 atoms with (a) ferromagnetic and (b) AFM RKKY interaction.
Susceptibility of non-interacting and interacting Fe atoms in Cu. Only pairs of Fe atoms interacting by positive or negative RKKY interactions are considered, and the susceptibility of the non-interacting system has been normalized to agree with the high-temperature part of the FM curve.
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