XRD patterns of Fe16N2 thin films L1 and L3. Both samples showed finger print peak (002) at 2θ = 28.5°.
(a) X-ray reflectivity of Fe16N2 samples L1 and L3, (b) electron SLD of L3 was homogeneous through the whole sample, and (c) SLD of L1 stayed the same after the first ∼2 nm bump.
(a) Reflectivity curve of L1, (b) NSLD and Ms depth profile of L1, (c) reflectivity curve of L3, and (d) NSLD and Ms depth profile of L3. Both (b) and (d) curves showed high Ms region near the substrate with a thickness of ∼5 nm.
In plane X-ray reflectivity of Fe/FeN on GaAs substrate. FeN was shown to possess a larger lattice constant of 5.75 Å due to the peak FeN (220).
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