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Assessment of the Holland model for silicon phonon-phonon relaxation times using lattice dynamics calculations
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10.1063/1.4803514
/content/aip/journal/jap/113/17/10.1063/1.4803514
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4803514

Figures

Image of FIG. 1.
FIG. 1.

(a) Temperature dependence of thermal conductivity for SW silicon predicted from LD calculations (symbols) and mode-dependent Holland fit (lines). (b)% thermal conductivity contribution of TA and LA modes.

Image of FIG. 2.
FIG. 2.

LD mode-dependent inverse relaxation times at 300 K, Holland and alternate predictions, and density of states for (a) TA and (b) LA.

Image of FIG. 3.
FIG. 3.

Normalized cumulative thermal conductivity as a function of frequency for (a) TA and (b) LA. Dashed-dotted lines: low temperatures (100 K and below). Black lines: high temperatures (200 K, 300 K, 500 K, and 1000 K). Red line: cubic fit to data at 300 K.

Image of FIG. 4.
FIG. 4.

RMSE of Holland and alternate predictions of cumulative thermal conductivity. (b) RMSE of Holland and alternate inverse relaxation time predictions.

Tables

Generic image for table
Table I.

Transverse and longitudinal inverse relaxation time forms corresponding to the Holland model, for both normal (N) and Umklapp (U) processes.

Generic image for table
Table II.

Fitted values of Holland model's parameters when: (i) only total thermal conductivity is considered and (ii) both total and mode-dependent thermal conductivities are considered. Note that impurity scattering was neglected in our calculations for consistency with our lattice dynamics simulations.

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/content/aip/journal/jap/113/17/10.1063/1.4803514
2013-05-06
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Assessment of the Holland model for silicon phonon-phonon relaxation times using lattice dynamics calculations
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4803514
10.1063/1.4803514
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