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Epitaxial strain effect in tetragonal SrRuO3 thin films
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10.1063/1.4803869
/content/aip/journal/jap/113/17/10.1063/1.4803869
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4803869
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Figures

Image of FIG. 1.
FIG. 1.

(a) X-ray 2theta-theta profiles of SRO thin films grown on (110) NGO and (110) GSO substrates. (b) 3 m × 2 m AFM surface morphology of the 20 nm-thick films on the NGO substrate. (c) Thickness dependence of the out-of-plane lattice spacing of the films on the NGO substrate. In (a), the reflections from the film and substrates are indexed by the pseudo-cubic and orthorhombic perovskite notations, respectively.

Image of FIG. 2.
FIG. 2.

Semi-logarithmic contour plots of x-ray reciprocal space mappings of the 20 nm-thick SRO films on NGO substrate. The mappings were recorded around (620), (444), (260), and (44-4) reflections of the substrates at room temperature.

Image of FIG. 3.
FIG. 3.

(a) Cross-sectional TEM images and (b) nanobeam electron diffraction pattern for the 9 nm-thick tetragonal film on the NGO substrate. For both the TEM image and the diffraction pattern, the incident electron beam is parallel to the [1-10] direction of the substrate.

Image of FIG. 4.
FIG. 4.

Temperature dependence of longitudinal resistivities of the tetragonal SRO films on NGO and GSO substrates. The ferromagnetic transition temperature c determined by the derivative of the curve is denoted by the arrows.

Image of FIG. 5.
FIG. 5.

(a) and (b) Magnetic field dependence of the transverse Hall resistivity for the tetragonal SRO films grown on (a) NGO and (b) GSO substrates. (c) Carrier density of the films as a function of temperature. (d) Hall mobility of the films as a function of temperature.

Image of FIG. 6.
FIG. 6.

Magnetic field angle dependence of the longitudinal resistivity (blue curve) and Hall resistivity (red curve) for the tetragonal films on NGO and GSO substrates at 10 K. The magnitude of the magnetic field was 1and 0.4 T for the film on the NGO and GSO substrates, respectively. In (a), the current was appliedalong the [100] direction (parallel to the [1-10] direction of the substrate) and the field was rotated in the (100) plane. In (b), the current wasapplied along the [001] direction (parallel to the [001] direction of the substrate) and the field was rotated in the (001) plane. In (c), the current was applied along the [100] direction and the magnetic field was rotated in the (010) plane. All data were taken at 10 K.

Image of FIG. 7.
FIG. 7.

Temperature-induced changes in magnetic field angle dependence of the longitudinal resistivity (blue curve) and Hall resistivity (red curve) for the tetragonal films on NGO substrate. The data were collected under a 1 T magnetic field. In (a), the current was applied along the [100] direction and the field was rotated in the (100) plane. In (b), the current was applied along the [001] direction and the field was rotated in the (001) plane. In the upper schematics, EA stands for the magnetic easy axis direction.

Image of FIG. 8.
FIG. 8.

Temperature-induced changes in magnetic field angle dependence of the longitudinal resistivity for the tetragonal films on GSO substrate. The magnetic field was rotated in the (010) plane. The current flows along the [100] direction. In the upper schematic, EA stands for the magnetic easy axis direction.

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/content/aip/journal/jap/113/17/10.1063/1.4803869
2013-05-07
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Epitaxial strain effect in tetragonal SrRuO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/17/10.1063/1.4803869
10.1063/1.4803869
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