(a) θ-2θ XRD scan of the BTFO thin films grown on the SRO/STO (001) substrate for x = 0.0, 0.1, and 0.2. (b) X-ray reciprocal map for BTO/SRO/STO(001) film measured around (103) Bragg reflection.
(a) Cross-sectional bright field TEM image showing the thickness and (b) HR-TEM image at the interface for the BTFO10 film grown on STO (001).
Atomic force microscopy image for 20 nm thick BTFO10 thin film grown on SRO/STO (001) substrate.
Ferroelectric hysteresis loops of BTFO/SRO/STO (001) films measured at a frequency of 2 kHz. Inset: polarization current (I P) for the BTFO10 and BTFO20 films.
Piezoforce response for the BTFO/SRO/STO (001) films: (a) phase vs. bias voltage and (b) piezoresponse vs. voltage.
XPS spectra of Fe 2p state of BTFO thin films on STO (001).
Magnetic hysteresis loops for the BTFO10 and BTFO20 thin films on STO (001) at room temperature. Inset: ZFC-FC curves of the BTFO10 sample as a function of temperature under H = 500 Oe.
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