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Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)
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10.1063/1.4803894
/content/aip/journal/jap/113/18/10.1063/1.4803894
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/18/10.1063/1.4803894

Figures

Image of FIG. 1.
FIG. 1.

LEED patterns of a pure MgO(001) surface and the five differently prepared samples. All patterns except for sample B were taken at an electron energy of 149 eV. For sample B, the diffraction pattern was taken at 104 eV. The larger blue square indicates the magnetite surface unit cell in reciprocal space while the smaller white square indicates the superstructure unit cell.

Image of FIG. 2.
FIG. 2.

XPS measurements of the Fe2p peak region for samples grown at (a)different substrate temperatures and (b) different deposition rates.

Image of FIG. 3.
FIG. 3.

Sketch of the reciprocal space (()-plane for ( = 0)) of the MgO(001)/iron oxide system. Open symbols mark reflections originating exclusively from the tetrahedral sites of the spinel structure (magnetite and maghemite). The dashed line represents MgO CTRs and the yellow shaded areas mark the regions studied by XRD and GIXRD here (cf. Figs. 4 and 6 ).

Image of FIG. 4.
FIG. 4.

Rod scans along the (00) rod for samples grown at (a) different substrate temperatures and (b) samples grown at different deposition rates. Open symbols show experimental data and solid lines show calculations.

Image of FIG. 5.
FIG. 5.

Iron oxide film layer distance as a function of substrate temperature (red squares) and deposition rate (blue circles), respectively. For comparison, the vertical atomic layer distance for bulk FeO is  = 2.161 Å (not shown here).

Image of FIG. 6.
FIG. 6.

Scans along the (01) rod for samples grown at (a) different substrate temperatures and (b) samples grown at different deposition rates.

Image of FIG. 7.
FIG. 7.

Intensity ratio between the (011) and ( ) reflection as a function of (a) substrate temperature (red squares) and (b) deposition rate (blue circles), respectively. Please note the logarithmic scale.

Image of FIG. 8.
FIG. 8.

Kerr rotation as a function of the magnetic field for the sample C grown at high deposition rate and .

Image of FIG. 9.
FIG. 9.

Calculated intensity along the (01) rod for a magnetite thin film for different values of . Please note the linear scale.

Image of FIG. 10.
FIG. 10.

Calculated intensity ratio between the (011) and ( ) reflection as a function of the occupancy parameter . The red circles show the experimental values obtained for the five samples.

Tables

Generic image for table
Table I.

Deposition parameters for the five samples studied here.

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/content/aip/journal/jap/113/18/10.1063/1.4803894
2013-05-09
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/18/10.1063/1.4803894
10.1063/1.4803894
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