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Stress-modulated exciton polariton Josephson effect in a semiconductor microcavity
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10.1063/1.4804422
/content/aip/journal/jap/113/18/10.1063/1.4804422
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/18/10.1063/1.4804422
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic illustration of a planar semiconductor microcavity. Excitons are excited in the QW at the center of two distributed Bragg reflectors (DBRs). (b) The dispersion relation of EPs in the lower branch. The EP condensate is formed at lowest energy state.

Image of FIG. 2.
FIG. 2.

(a) Time evolution of the Josephson current with the different stresses. (b) Josephson current varying with the stress. The parameters used are m and m in both panels.

Image of FIG. 3.
FIG. 3.

The critical value as a function of the pumping rates in both traps ( and ).

Image of FIG. 4.
FIG. 4.

(a) Josephson current vs time with the different stresses. (b) Josephson frequency varying with the stress. The solid line in (b) denotes the Josephson frequency calculated without the interactions between EPs, and the dotted line with stars includes the interaction. The parameters in the calculations are from Fig. 2 .

Image of FIG. 5.
FIG. 5.

(a) Time evolution of the population imbalance and (b) Condensate densities of EPs in both traps at different time. kbar in (b). The parameters used are meV m and meV m in both panels.

Image of FIG. 6.
FIG. 6.

(a) Time evolution of the Josephson current with the different external driving frequencies. (b) Time-average energy difference varying with the stress . kbar in (a); and 0.8 THz for the solid and dotted line, respectively, in (b). meV m, meV m, and in both panels.

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/content/aip/journal/jap/113/18/10.1063/1.4804422
2013-05-09
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stress-modulated exciton polariton Josephson effect in a semiconductor microcavity
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/18/10.1063/1.4804422
10.1063/1.4804422
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