(a) Schematic illustration of a planar semiconductor microcavity. Excitons are excited in the QW at the center of two distributed Bragg reflectors (DBRs). (b) The dispersion relation of EPs in the lower branch. The EP condensate is formed at lowest energy state.
(a) Time evolution of the Josephson current with the different stresses. (b) Josephson current varying with the stress. The parameters used are μm−2 and μm−2 in both panels.
The critical value as a function of the pumping rates in both traps (PL and PR ).
(a) Josephson current vs time with the different stresses. (b) Josephson frequency varying with the stress. The solid line in (b) denotes the Josephson frequency calculated without the interactions between EPs, and the dotted line with stars includes the interaction. The parameters in the calculations are from Fig. 2 .
(a) Time evolution of the population imbalance and (b) Condensate densities of EPs in both traps at different time. kbar in (b). The parameters used are meV μm−2 and meV μm−2 in both panels.
(a) Time evolution of the Josephson current with the different external driving frequencies. (b) Time-average energy difference varying with the stress . kbar in (a); and 0.8 THz for the solid and dotted line, respectively, in (b). meV μm−2, meV μm−2, and in both panels.
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