X-ray reflectivity patterns and the respective fitting using the WINGIXA program from Phillips for the TTa-15nm (a) and TCu-12nm (b) samples.
X-ray diffraction patterns for the TCu (a) and TTa (b) samples as a function of the IrMn thickness (tIrMn), with values indicated in the figure. Full black circles are due to the (111) fcc-IrMn structure. Si substrate peak is also displayed by full grey circle. In Figure (b), it is shown the asymmetric peak attributed to Co and NiFe phase (2θ ∼ 44°), which was fitted with two Gaussian lines, as shown for tIrMn = 8 nm.
300 K hysteresis loops for the TCu-6 nm (a) and TTa-8 nm (b) samples cooled down from 400 K to 300 K under magnetic fields applied of 10 Oe in 0°, 45°, 70°, and 90° with respect to the  direction of the Si substrate.
300 K hysteresis magnetic loops of the samples TCu-6 nm (a), TCu-15nm (b), TTa-6 nm (c), and TTa-15nm (d) recorded for the as-prepared films (black disk) and in 10 Oe field-cooling process from 400 K to 300 K (red square). The identifications of the NiFe and Co loops are in (b) by vertical arrows. The inset at the first quadrants shows the interlayer coupling at H = 0 and the insets at the second and third quadrants in (b) represent the interlayer coupling at the saturated condition.
Dependence of the Hex ((a), (c)) and HC ((b), (d)) of the NiFe and Co layers as a function of the tIrMn for the TCu ((a), (b)) and TTa ((c), (d)) samples. The solid and dashed lines are guide for the eyes.
In-plane (red) and out-of-plane (black) 300 K FMR spectra of the TCu-15nm (a) and TTa-15nm (c) samples presenting two independent modes for the NiFe and Co layers. The angular phase Δθ between the NiFe and Co magnetization directions as a function of the IrMn thickness (tIrMn) for the TCu (b) and TTa (d) samples.
Theoretical values of thicknesses and roughnesses obtained from the fitting of the X-ray reflectivity patterns for the TTa-15nm (a) and TCu-12nm (b) samples.
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