(a) XRD linear scans around NGO(002) (sharp peak at 2θ = 47.074°) and LCMO(002) reflections from LCMO/NGO(001) films deposited at different P O. Scans are shown offset for clarity. (b) XRD RSMs on (103) reflections from films deposited at 45-20 Pa. Arrows indicate the central position of NGO(103) and LCMO(103) along the out-of-plane direction. (c) AFM images from films deposited at 45-20 Pa.
ρ-T curves measured at zero-field from LCMO/NGO(001) films deposited at (a) 45, 35, and 30 Pa and (b) 25, 20, and 15 Pa. In (c)–(h), films were measured under various magnetic fields.
FC-ZFW ρ-T curves [(a) and (c)] and isothermal ρ-H curves [(b) and (d)] measured from films deposited at 45 and 15 Pa, respectively. FC-ZFW ρ-T curves were measured after FC the film from 320 to 10 K at 7 T. ρ-H curves were measured after ZFC the film to the stated temperature. ZFC-ZFW ρ-T curves are also shown in (a) and (c) for comparison.
ZFC-ZFW ρ-T curves from as-grown and annealed films deposited at (a) 45 and (c) 15 Pa. XRD linear scans around the LCMO (002) reflections of these films are shown in (b) and (d), respectively.
(a) ZFC-ZFW ρ-T curves from annealed LCMO/NGO(110) films deposited at 45, 30, 20, and 15 Pa. (b) XRD linear scans around the NGO(220) and LCMO(220) reflections from LCMO/NGO(110) films deposited at different P O. Scans are shown offset for clarity.
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