Plot of resistance vs. distance for a mesa structure, showing raw resistance data (open circle) as well as data corrected for the geometry (black square) of the circular test structures.
XRD data for 1 wt. % Ga-doped ZnO deposited onto (100) single crystalline Si substrates, deposited at varying oxygen deposition pressures.
Hall measurement data, featuring resistivity (dot in square), mobility (open circle in square), and carrier density (closed circle) as a function of oxygen pressure deposition environment.
UV-vis measurements of transparency as a function of O2 deposition pressure.
Reflectance vs. Wavelength data for GZO films varying from 60 nm to 225 nm on textured, monocrystalline Si solar cells, as well as a commercial SiNx ARC on a similarly textured cell.
CTLM measurements: measured sheet resistance, expected sheet resistance (from four-point probe technique), transfer length, contact resistivity, and goodness of fit.
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