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Ga-doped ZnO conducting antireflection coatings for crystalline silicon solar cells
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10.1063/1.4811538
/content/aip/journal/jap/113/23/10.1063/1.4811538
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/23/10.1063/1.4811538

Figures

Image of FIG. 1.
FIG. 1.

Plot of resistance vs. distance for a mesa structure, showing raw resistance data (open circle) as well as data corrected for the geometry (black square) of the circular test structures.

Image of FIG. 2.
FIG. 2.

XRD data for 1 wt. % Ga-doped ZnO deposited onto (100) single crystalline Si substrates, deposited at varying oxygen deposition pressures.

Image of FIG. 3.
FIG. 3.

Hall measurement data, featuring resistivity (dot in square), mobility (open circle in square), and carrier density (closed circle) as a function of oxygen pressure deposition environment.

Image of FIG. 4.
FIG. 4.

UV-vis measurements of transparency as a function of O deposition pressure.

Image of FIG. 5.
FIG. 5.

Reflectance vs. Wavelength data for GZO films varying from 60 nm to 225 nm on textured, monocrystalline Si solar cells, as well as a commercial SiNx ARC on a similarly textured cell.

Tables

Generic image for table
Table I.

CTLM measurements: measured sheet resistance, expected sheet resistance (from four-point probe technique), transfer length, contact resistivity, and goodness of fit.

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/content/aip/journal/jap/113/23/10.1063/1.4811538
2013-06-19
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ga-doped ZnO conducting antireflection coatings for crystalline silicon solar cells
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/23/10.1063/1.4811538
10.1063/1.4811538
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