(a) Array of gold nanopillars with height w 0 = 60 nm, radius R = 25 nm, and inter-pillar separation H = 500 nm.
Graphene on gold pillars with height w 0 = 60 nm and inter-pillar separation H = 500 nm. (a) Scanning electron micrograph at 60° inclined to the vertical. (b) Top view of the same region. (c) High-angle SEM image of the same region posterior to AFM scanning. The pillars A, B, and C were knocked out and pillar D was destroyed by the moving sharp tip. (d) Topography of the same region showing shadow effects due to AFM tip geometry.
SEM image of graphene on gold pillars with height w 0 = 100 nm and inter-pillar separation H = 500 nm: Blister A is one of the many coalesced blisters in this sample. Blister B is torn on one side resulting in lateral corrugation. C is a pillar bent by the graphene from above. Region D is a cluster of nano-Au particles and pillar debris covered by an irregular shape graphene blister.
Schematics of two adjacent blisters.
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