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Improved accuracy thin film permeability extraction for a microstrip permeameter
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10.1063/1.4776715
/content/aip/journal/jap/113/3/10.1063/1.4776715
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/3/10.1063/1.4776715

Figures

Image of FIG. 1.
FIG. 1.

(a) Open microstrip permeameter, (b) side view of the permeameter with parts labeled, (c) front cross-section of the microstrip permeameter at the material under test emphasizing the field structure.

Image of FIG. 2.
FIG. 2.

(a) Cross sectional view of the microstrip permeameter without the sample under test indicating the loop and dipole components. (b) and (c) RF circuit of a microstrip permeameter including soldering and other manufacturing defects.

Image of FIG. 3.
FIG. 3.

(a) Real and (b) imaginary parts of the input impedance of an empty microstrip permeameter.

Image of FIG. 4.
FIG. 4.

Dependence of “K” factor on real valued permeance ( ).

Image of FIG. 5.
FIG. 5.

Magnetic field structure for a 10 μm-thick ferrite with permeability of (a) 5 and (b) 1000.

Image of FIG. 6.
FIG. 6.

Derived morphology function for a 50 Ω microstrip permeameter. Simulation errors arise when the sample is in the diaphanous limit (v > 0.1).

Image of FIG. 7.
FIG. 7.

Examples of the measured (a) input impedance and (b) derived of a Ni-Zn-Co ferrite.

Image of FIG. 8.
FIG. 8.

Real and imaginary parts of the permeability for (a) Ni-Zn-Co 20.3 μm thick ferrite and (b) 1.2 μm Ni-Zn ferrite as deposited by ASU's spin spray depositor. The dashed curve in (b) was generated using K value obtained from (a).

Image of FIG. 9.
FIG. 9.

(a) and (b) Comparison of extracted film permeability with an ideal Debye material using full-wave simulations, real and imaginary permeabilities, respectively. (c) % absolute error including real and imaginary using different extraction methods. Square symbols is our method, cross symbols is using constant K from the reference sample in Fig. 8(a) and diamond symbols is using constant K assuming that we have the correct Ms and Ha a priori from a magnetometer measurement.

Image of FIG. 10.
FIG. 10.

(a) Cross-section of the microstrip permeameter prototype with the sample. (b) % error observed in simulations of a Lorentz material for different sample thicknesses “t” when the sample is placed on top of the ground plane (z = 0). (c) % error observed in simulations for different sample height “z” for a 10 μm sample (t = 10 μm).

Image of FIG. 11.
FIG. 11.

Error associated with incorrect effective permittivity in the Ni-Zn-Co ferrite shown in Fig. 9(a) . Filled symbol curves represent permeability for an error of −10% in and unfilled symbol curves are for an error of +10% in .

Tables

Generic image for table
Table I.

Parasitic circuit elements of the permeameter prototype.

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/content/aip/journal/jap/113/3/10.1063/1.4776715
2013-01-17
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Improved accuracy thin film permeability extraction for a microstrip permeameter
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/3/10.1063/1.4776715
10.1063/1.4776715
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