(a) Fabrication process flow. (b) Microscope image of completed device.
Streak spectrograph test setup.
Streak spectrograph of a Ni/Al conductor heated from a current pulse originating in a 0.3 μF capacitor charged to 1.2 kV.
Al, Ni, and Ni/Al normalized sample emission at 300 ns following the onset of emission, with major peaks identified.
Emission intensity (solid lines) and specific electrical energy (dashed lines) vs. time for Al, Ni, and Ni/Al at 499.6 ± 1.5 nm. This wavelength range was near a set of spectral peaks common to all samples.
Measured and predicted flyer velocities vs. time for a 2.8 μm thick Al bridge.
Measured and corrected specific electrical power (P) and energy (Q) delivered to a 2.8 μm thick Al bridge. Corrected energy is based on Eq. (5) , and corrected power is based on the numerical derivative of corrected energy. Expected melt, atomization, and ionization events are also labeled along the measured energy curve.
Measured and predicted flyer velocities vs. time for a 5.6 μm thick Al bridge and a 2.8 μm Ni bridge.
Measured and predicted flyer velocities vs. time for a 2.6 μm thick, multilayered Ni/Al laminate bridge, along with measured and corrected electrical power curves normalized by bridge mass. The dashed predicted velocity curve does not account for exothermic mixing between Ni and Al, while the solid curve was predicted by an additional energy term in the model to account for this mixing.
Atomization and ionization energies for materials used in this study.
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