(a) In situ RHEED images of a LCMO film grown at 26 Pa oxygen. (b)The zero-field curves of the film measured along  and  directions. The thin red lines are the transverse resistivity normalized to their respective room temperature longitudinal value. The inset is the schematic diagram of the Hall bar. (c) The typical AMR and PHE curves measured. The scattered spots are experimental data and the lines are fitting of the backward data using Eq. (1) .
The temperature dependencies of AMR and PHE measured at various magnetic fields along the  direction.
AMR and PHE measured at (a) 220 K and (b) 100 K, along the  direction (top) and the  direction (bottom). (c) AMR and PHE for a film grown on STO measured along the  direction at different temperatures in a field of 8000 Oe. The scattered spots are experimental data and the lines are fitting results.
The magnetic field dependencies of AMR and PHE measured along  direction at 180, 220 and 260 K. The four-fold term in AMR at 180 K is also plotted in the top panel, whose vertical axis is rescaled in the inset of the bottom panel.
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