Time dependence of the  diffraction rod intensity of a typical RHEED pattern during calibration for the case of (a) Sr-rich layers, (b) Cu-rich layers, and (c) with the Sr/Cu ratio close to 1. In each panel, the first opening Cuon-Sron and closing Cuoff-Sroff times of the Cu/Sr shutters are indicated by arrows.
Typical RHEED pattern of a (001) Sr1– x La x CuO2 epitaxial thin film viewed along the  p azimuth (a) at the end of the growth, and (b) after the vacuum annealing step. Note the presence of the extra (arrowed) streak in (a), which vanishes during the vacuum annealing step (b).
(a) Reciprocal space map along h and k of a Sr0.9La0.1CuO2 film grown on a (110) GdScO3 substrate around the symmetric 002 p Bragg reflections (the units of h and k are those of the GdScO3 pseudocubic reciprocal lattice). Rocking curves of the 002 p reflections of the film ((b) blue curve) and of the substrate ((c) red curve).
In situ photoemission spectroscopy using He-Iα light (21.2 eV) showing the O 2p-derived valence band in as-grown (blue) and vacuum annealed (red) Sr0.90La0.10CuO2 films. A significant change in the valence band is observed after vacuum annealing, indicating electron-doping via the removal of excess electron-accepting oxygen atoms. The spectra have been normalized at high binding energy (∼10 eV).
Room temperature normalized resistivity curves for three Sr1– x La x CuO2 samples with different La concentrations. Data refer to films with La content x equal to 0.08 (red squares, (a)), 0.10 (green circles, (b)) and 0.13 (blue triangles, (c)). Straight lines are guides to the eye. Insets show low-temperature resistivity and corresponding best-fit curves using a log-log scale.
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