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Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy
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10.1063/1.4790363
/content/aip/journal/jap/113/5/10.1063/1.4790363
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/5/10.1063/1.4790363
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Sample SEM pictures: (a) Top view of the Whatman alumina matrix partially filled with Bi2Te3 nanowires whose diameter ranges between 200 nm and 400 nm, (b) Cross section view of the sample before polishing.

Image of FIG. 2.
FIG. 2.

SThM imaging of Bi2Te3 nanowires embedded in an alumina matrix. (a) Topographic image. Yellow spots in this figure reveal the presence of nanowires. (b) (V)Tip image. The centers of the nanowires show a lower (V)Tip signal due to an increase of the heat flux in this region.

Image of FIG. 3.
FIG. 3.

Equivalent thermal resistance distribution on the alumina and NWs parts of the sample.

Image of FIG. 4.
FIG. 4.

Tip image (top left) and equivalent thermal schema of the thermal flux passing from the tip to a NW.

Image of FIG. 5.
FIG. 5.

Composite thermal conductivity distribution on around 50 NWs.

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/content/aip/journal/jap/113/5/10.1063/1.4790363
2013-02-06
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/5/10.1063/1.4790363
10.1063/1.4790363
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