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Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum
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10.1063/1.4791714
/content/aip/journal/jap/113/6/10.1063/1.4791714
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/6/10.1063/1.4791714
/content/aip/journal/jap/113/6/10.1063/1.4791714
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/content/aip/journal/jap/113/6/10.1063/1.4791714
2013-02-13
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/6/10.1063/1.4791714
10.1063/1.4791714
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