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Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum
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10.1063/1.4791714
/content/aip/journal/jap/113/6/10.1063/1.4791714
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/6/10.1063/1.4791714

Figures

Image of FIG. 1.
FIG. 1.

Time dependence of insulation resistance of Ni-MLCCs during HALT. (a) Duration time: 100 h (sample A) and (b) duration time: 215 h (sample B).

Image of FIG. 2.
FIG. 2.

(a) Topographic image and (b) corresponding surface potential image of the cross section of sample B under external backward bias voltage of 5 V.

Image of FIG. 3.
FIG. 3.

Surface potential images on the dielectric layers of (a) fresh MLCC, (b) sample A, and (c) sample B under a forward bias voltage as well as (d) fresh MLCC, (e) sample A, and (f) sample B under a backward bias voltage. The applied dc voltage is 5 V. For sample A and sample B, the forward and backward bias corresponds to the same and opposite direction of applied electric field in HALT, respectively. The polarity of the voltage was reversed at the same place. The scale bar shown in each figure represents 1 μm.

Image of FIG. 4.
FIG. 4.

Typical line profiles of surface potential for (a) fresh MLCC, (b) sample A, and (c) sample B under a forward bias of 5 V. For sample A and sample B, the forward bias corresponds to the same direction applied electric field in HALT.

Image of FIG. 5.
FIG. 5.

Electric field images for the cross sections of (a) fresh MLCC under forward bias, (b) fresh MLCC under backward bias, (c) sample A under forward bias, (d) sample A under backward bias, (e) sample B under forward bias, and (f) sample B under backward bias. The applied dc voltage is 5 V. For sample A and sample B, the forward and backward bias corresponds to the same and opposite direction of applied electric field in HALT, respectively. The polarity of the voltage was reversed at the same place. The scale bar shown in each figure represents 1 μm.

Image of FIG. 6.
FIG. 6.

Electric field images of (a) fresh MLCC, (b) sample A, and (c) sample B, and (d) line profiles of electric field for fresh MLCC, sample A, and sample B, obtained under a forward external bias of 5 V. Each line profile was obtained from the positions indicated by red arrows shown in (a), (b), and (c).

Image of FIG. 7.
FIG. 7.

Energy band diagram of Ni/BaTiO3/Ni heterojunction system for (a)fresh MLCC before contact, (b) degraded MLCC before contact, (c)degraded MLCC after contact, (d) degraded MLCC under the forward bias condition, and (e) degraded MLCC under the backward bias condition.

Image of FIG. 8.
FIG. 8.

Electric field images of sample B when switching polarity of bias voltage from (a) forward, to (b) backward, to (c) forward, to (d) backward. Forward and backward bias corresponds to the same and opposite direction of applied electric field in HALT, respectively.

Tables

Generic image for table
Table I.

Measurement condition of UHV-KFM

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/content/aip/journal/jap/113/6/10.1063/1.4791714
2013-02-13
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/6/10.1063/1.4791714
10.1063/1.4791714
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