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Effect of hydrogen incorporation on the negative bias illumination stress instability in amorphous In-Ga-Zn-O thin-film-transistors
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10.1063/1.4792229
/content/aip/journal/jap/113/6/10.1063/1.4792229
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/6/10.1063/1.4792229
/content/aip/journal/jap/113/6/10.1063/1.4792229
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/content/aip/journal/jap/113/6/10.1063/1.4792229
2013-02-14
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of hydrogen incorporation on the negative bias illumination stress instability in amorphous In-Ga-Zn-O thin-film-transistors
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/6/10.1063/1.4792229
10.1063/1.4792229
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