2θ-ω XRD scans of ZFO thin films grown at different temperatures. Left: a wide-angle scan for a film grown at 625 °C is shown. The ZFO reflexes are indicated in blue and the substrate reflexes in green. Weak peaks not labeled are reflexes from the substrate. Right: an enlarged part of the spectrum with only the ZFO (222) and the substrate (110) peaks for films grown at the given temperatures. The shift of the ZFO (222) peak toward smaller angles for decreasing growth temperature is visible.
Left: absorption coefficient for ZFO films grown at the indicated temperatures. The increase of the high energy peak as well as the shift of the fundamental absorption edge is clearly visible. In the inset the low energy region with the faint absorption peak is shown. The two linear fits to determine the critical point transitions are indicated by the blue line. Right: refractive index in the transparent spectral rage determined from the Cauchy model.
(left) and Δ (right) for two different angles of incidence and the respective values calculated from the parametric model (red). Data are for a ZFO film grown at 625 °C.
Left: optical constants obtained from mathematical inversion (black) and the parametric model (red/orange). The individual contributions to the parametric model are depicted in green. Data are for a ZFO film grown at 625 °C. Right: energies of the observed transitions in dependence on growth temperature as derived from the model dielectric function.
All relevant energies and the lattice constant a in dependence on growth temperature. and are the energies determined from linear fits to . G1 through G6 and CP are the energies of the observed transitions as derived from the model dielectric function.
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