(a) SEM image of the thermal scanning probe. (b) SEM image of the active region of the tip. The Au layer does not cover the entire tip, but is mostly concentrated in the active area. The tip has a radius of curvature between 50 nm and 500 nm.
SEM image of the calibration sample, which consists of 2 parallel gold wires that are 400 μm long, 1 μm wide, and 15 nm thick.
Schematic of the experimental setup for noise thermometry measurements.
Average excess white noise power density vs. I2. The experimental data (points) are linear, and a fit (line) gives a slope of 3.53−14 V2/A2 Hz1/2. At 4.5 mA, the increase in temperature is 16.3 K.
(a) A two-dimensional XY plot of the scanning thermal probe's resistance change over the wire with ΔT of 1.6 K. (b) The plot of the measured peak height, ΔR, as a function of bias currents squared applied at the wire shows that the probe signal is due to the excess temperature of the wire. Inset: Line scan of the probe over the gold wire at ΔTwire = 1.6 K, corresponding to ΔRprobe = 0.03 Ω. The probe is scanned perpendicular to the wire.
Cross-sectional temperature distribution of a 600-nm radius tip.
A plot of the surface temperature of the metal element versus distance X along the horizontal axis from the contact point for the three values of tip radii: 100 nm, 300 nm, and 700 nm.
Temperature conversion factor, η, versus tip radius for two different thermal probe patterns.
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